Authored the monograph "Digital Integrated Circuit Testing: Theory, Methods and Practice" (Tsinghua University Press, June 2024)
Published numerous papers in top-tier journals such as IEEE TCAD and IEEE TC, covering topics like fault protection in RRAM-based neural networks, GNN accelerators, and Trojan detection in instruction sets
Paper “EnGN: A High-Throughput and Energy-Efficient Accelerator for Large Graph Neural Networks” received the IEEE TC Best Paper Award (2021)
Serves as Associate Editor for multiple international journals including IEEE Transactions on VLSI Systems, IEEE Design & Test, and Journal of Computer Science & Technology
Has held leadership roles in major conferences, including Program Co-Chair of IEEE ATS’18 and ITC-Asia’18, and Chair of Steering Committees
Currently Chair of the CCF Special Committee on IC Design (2024–2027)
Research Experience
Jun 2022 – Present: Deputy Director, National Key Laboratory of Processor Chips, Institute of Computing Technology, CAS; Researcher
Oct 2008 – May 2022: Deputy Director (2020–2022) and Researcher, State Key Laboratory of Computer Architecture, ICT, CAS
Aug 2009 – Aug 2010: Visiting Professor, Department of Electrical and Computer Engineering, UC Santa Barbara, USA
Oct 2001 – Sep 2008: Associate Researcher, Network Division / Key Laboratory of Computer System Architecture, CAS