Should I Use This Synthetic Dataset for Training? How to Test with Minimal Real Data

📅 2026-08-28
📈 Citations: 0
Influential: 0
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🤖 AI Summary
本文解决如何用最少的真实数据测试合成数据集对AI模型训练效果的影响,提出了一种自适应e-过程符号翻转测试方法。
📝 Abstract
Digital twins (DTs) and learned world models are increasingly used to generate synthetic data that augment the scarce real datasets available for training artificial intelligence (AI) models in engineering systems. Owing to the inevitable simulation-to-reality (sim-to-real) gap, however, augmentation may fail to improve the performance of the trained model on the real data distribution. This paper addresses the resulting decision problem: Given a real dataset, a candidate synthetic dataset, and a fixed learning algorithm, decide whether training on the augmented dataset improves the true, population-level performance, while consuming as few real test data points as possible. Two formulations are considered: a direct test on the mean loss difference between the two trained models, and a symmetry-based test on the paired loss difference, which trades a stronger null assumption for faster evidence accumulation. For the latter, we introduce the {adaptive e-process sign-flip test} (aeSFT), a doubly adaptive procedure that adapts both the number of Monte Carlo sign-flip rounds, and hence the computational cost, and the amount of real test data consumed. aeSFT yields anytime-valid Type-I error control, with no need to pre-specify the test-set size. Experiments on a synthetic-data classification task, a DT-aided wireless packet-scheduling task, and a radio-map prediction task show that aeSFT identifies useful synthetic data using substantially fewer real test samples than mean-based sequential testing, matches the power of fixed-sample sign-flip testing and the paired $t$-test, while keeping the false-positive rate below the target level.
Problem

Research questions and friction points this paper is trying to address.

synthetic dataset
real data distribution
augmentation
performance improvement
minimal real test data
Innovation

Methods, ideas, or system contributions that make the work stand out.

adaptive e-process sign-flip test
synthetic data
sim-to-real gap
Type-I error control
minimal real data