Eunha Lee
Scholar

Eunha Lee

Google Scholar ID: nXM39mIAAAAJ
SAIT (Samsung Advanced Institute of Technology), Samsung Electronics
Microscopy & spectroscopyelectron tomography2D materialhigh-k dielectricoxide TFT
Citations & Impact
All-time
Citations
11,120
 
H-index
41
 
i10-index
75
 
Publications
20
 
Co-authors
0
 
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Resume (English only)
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Co-authors: 0 (list not available)