Automated Palynological Analysis System: Integrating Deep Metric Learning and $U^{2}$-Net Detection in $H\infty$ bright field microscopy
Traditional pollen analysis is time-consuming (4–6 hours per sample) and highly subjective. This study proposes an automated, high-throughput microscopic analysis system that integrates brightfield imaging, $H_\infty$ robust mechanical control, and a deep learning pipeline to enable efficient, accurate counting, classification, and morphological characterization of pollen from the Bio Bío region of Chile. The approach combines U²-Net for salient object detection with a DINOv2 vision transformer classifier based on deep metric learning, augmented by a gradient-weighted attention mechanism to generate interpretable texture and diagnostic features. The system achieves a classification recall of 95.8% and processes samples six times faster than human experts.