Mouin Ben Ammar
Scholar

Mouin Ben Ammar

Google Scholar ID: zBDRc_0AAAAJ
ENSTA Paris, IP Paris, Safran
artificial intelligencedeep learningrepresentation learninguncertainty quantification
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Double Descent Meets Out-of-Distribution Detection: Theoretical Insights and Empirical Analysis on the role of model complexity
arXiv.org · 2024
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