Maksim Jenihhin
Scholar

Maksim Jenihhin

Google Scholar ID: v3_CtPwAAAAJ
Dept. of Computer Systems, Tallinn University of Technology
nanoelectronics reliabilitysystem dependabilityverification and debugfault tolerance and resilienceEDA methodologies
Citations & Impact
All-time
Citations
753
 
H-index
14
 
i10-index
22
 
Publications
20
 
Co-authors
30
list available
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