Scholar
Yuqi Wang
Google Scholar ID: nsxRDqQAAAAJ
The HongKong University of Science and Technology
Oxide Semiconductor
Device Reliability
Process Integration
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Citations & Impact
All-time
Citations
91
H-index
6
i10-index
4
Publications
15
Co-authors
0
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Publications
3 items
XALPHA: A Memory-Driven AI Quant Researcher for Hypothesis-to-Code Alpha Discovery
2026
Cited
0
Image-to-Video Diffusion: From Foundations to Open Frontiers
2026
Cited
0
R$^3$L: Reasoning 3D Layouts from Relative Spatial Relations
2026
Cited
0
Resume (English only)
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Co-authors: 0 (list not available)