Tsuyoshi Ide
Scholar

Tsuyoshi Ide

Google Scholar ID: g7hFrbAAAAAJ
IBM T. J. Watson Research Center
Machine learningdata mininganomaly detection
Citations & Impact
All-time
Citations
1,312
 
H-index
21
 
i10-index
35
 
Publications
20
 
Co-authors
68
list available
Publications
20 items
Browse publications on Google Scholar (top-right) ↗
Resume (English only)
Academic Achievements
  • Published core algorithms in top conferences such as AAAI, IJCAI, ICDM, and SDM. Recent research focuses on event causality analysis, graph neural networks, and black-box anomaly attribution, with publications in NeurIPS 21, AISTATS 24, AAAI 22, ICASSP 23, AAAI 21, KDD 23, SDM 25, and WSC 25.
Research Experience
  • Currently, he is the Head of Data Science at IBM Semiconductors, where he formulates R&D roadmaps for technical differentiation of IBM’s Manufacturing Execution System (MES) using AI/ML technologies. Previously, he was a Senior Technical Staff Member at IBM Thomas J. Watson Research Center, performing basic and applied research in AI, leading customer engagements, and providing technical guidance.
Education
  • Received a B.Eng. in Mechanical Engineering from Tohoku University, Japan, in 1993; an M.Sc. in Physics from the University of Tokyo, Japan, in 1997; and a Ph.D. in Physics from the University of Tokyo, Japan, in 2000, under the supervision of Prof. Akio Kotani.
Background
  • Serves as the Head of Data Science at IBM Semiconductors, focusing on modeling real-world business problems using advanced machine learning methods. Specializes in anomaly detection and attribution in industrial data, including multivariate time-series and stochastic event data.
Miscellany
  • Enjoys collecting antique computer keyboards and shares his collection on his YouTube channel. He also runs a website about the history of modern computer keyboards (in Japanese).