Scholar
Sunil Jaiswal
Google Scholar ID: dUEcwL8AAAAJ
K|Lens GmbH
Citations & Impact
Citations
533
H-index
14
i10-index
18
Publications
20
Co-authors
30
list available
Publications
Resume (English only)
Academic Achievements
- - Paper: Expanding Synthetic Real-World Degradations for Blind Video Super Resolution, IEEE CVPR Workshops, 2023
- - Paper: High-Resolution Synthetic RGB-D Datasets for Monocular Depth Estimation, IEEE CVPR Workshops, 2023
- - Paper: Leveraging Multi-view Data for Improved Detection Performance: An Industrial Use Case, IEEE CVPR Workshops, 2023
- - Paper: Edge-aware Consistent Stereo Video Depth Estimation, Arxiv'2023
- - Award: Best Research and Innovation Award, 2017, Technicolor R&D
Research Experience
- - Jan'2018 - Present: Computer Vision Researcher at K|Lens, GmbH, Germany
- - Sep'2012 - Dec'2017: Ph.D. Candidate at HKUST, Hong Kong, supervised by Prof. Oscar Au & Prof. Mattew McKay
- - Apr'2015 - Mar'2016: Visiting Scholar at Stony Brook University, USA & SUNY Korea, supervised by Klaus Mueller
- - Dec'2015 - Dec'2017: Worked with Prof. Lu Fang, Tsinghua University, China
- - June'2017 - Oct'2017: Research internee at Technicolor R&D, France, supervised by Dr. F. Galpin, Dr. R. Fabien
- - Jun'2011 - Aug'2011: Research internee at CBIA, Czech Republic, supervised by M. Kozubek, D. Svoboda
- - May - Aug'2010 & 2012: Reseach internee at IIT Jodhpur, INDIA, supervised by Prof. Anil Tiwari
Education
- - Ph.D., The Hong Kong University of Science & Technology (HKUST), 2017, supervised by Prof. Oscar Au & Prof. Mattew McKay.
- - Visiting Scholar at Stony Brook University, USA & SUNY Korea, 2015-2016, supervised by Prof. Klaus Mueller.
- - Bachelor's degree from LNMIIT, India, 2012, in the ECE department, supervised by Prof. Anil Tiwari.
Background
- Research interests include: low-level vision (real-world image and video super-resolution/deblurring/denoising), geometric vision (multi-view and monocular depth estimation, unsupervised video depth estimation, optical flow), and high-level vision (anomaly detection, defect detection/segmentation/classification). Currently working as a Computer Vision Researcher at K|Lens GmbH, leading the computer vision-AI R&D team, focusing on turning research prototypes into real-world products.
