Subed Lamichhane
Scholar

Subed Lamichhane

Google Scholar ID: OAOdblkAAAAJ
VLSI Systems and Computation Laboratory, University of California, Riverside
Artificial IntelligenceVLSI ReliabilityVLSI CADVLSI EDA
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Citations & Impact
All-time
Citations
41
 
H-index
3
 
i10-index
2
 
Publications
13
 
Co-authors
6
list available
Contact
No contact links provided.
Publications
1 items
BPINN-EM-Post: Stochastic Electromigration Damage Analysis in the Post-Void Phase based on Bayesian Physics-Informed Neural Network
2025
Cited
0
Resume (English only)
Co-authors
6 total
Sheldon X.-D. Tan
Sheldon X.-D. Tan
University of California at Riverside
Co-author 2
Co-author 2
Co-author 3
Co-author 3
Co-author 4
Co-author 4
Haotian Lu
Haotian Lu
PhD student at UC Riverside
Liang Chen
Liang Chen
Shanghai University