Acquisition Geometry-Assisted Whole-Group Localization of X-ray Fluorescence Maps in Optical Microscopy Images

2026-08-18

AI Summary

该研究通过利用采集几何信息和组交并比(GroupIoU)方法，解决了X射线荧光(XRF)图在光学显微图像中定位的问题，提高了多尺度下XRF视野的定位精度。

Abstract

X-ray fluorescence (XRF) microscopy maps elemental distributions, while optical microscopy can provide complementary morphological context. Localizing XRF fields of view (FOVs) in optical images is difficult because the two modalities differ in contrast mechanism and resolution. Most current workflows place each XRF tile independently, even when acquisition metadata already record the tiles' relative scan positions. This study formalizes XRF tile-group localization, in which one optical-frame placement is estimated for the whole group, constrained by acquisition geometry and quantified using group intersection-over-union (GroupIoU). In a controlled case study, independent localization failed with GroupIoU 0.000, whereas group localization achieved 0.931. Replacing the normalized cross-correlation (NCC) metric with mutual information (MI) gave nearly identical results, showing that the outcome is not specific to one local similarity metric. In another multiscale case study, using a coarse XRF survey scan to connect the fine-scale tile group to the optical image increased mean GroupIoU from 0.694 to 0.856. These case studies support using acquisition geometry as an explicit constraint when localizing related XRF tiles.

Problem

• X-ray fluorescence
• optical microscopy
• localization
• field of view
• acquisition geometry

Innovation

• Acquisition Geometry
• Whole-Group Localization
• Group Intersection-over-Union (GroupIoU)
• X-ray Fluorescence (XRF)