ROBIN: Incremental Oblique Interleaved ECC for Reliability Improvement in STT-MRAM Caches

πŸ“… 2019-01-21
πŸ›οΈ Asia and South Pacific Design Automation Conference
πŸ“ˆ Citations: 20
✨ Influential: 0
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πŸ€– AI Summary
This work addresses the inefficacy of conventional error-correcting codes (ECCs) in STT-MRAM caches, where data-dependent error patterns significantly exacerbate failure rates. To overcome the limitations of traditional ECCs under spatially and temporally correlated errors, the authors propose ROBINβ€”a novel incremental diagonal-interleaved ECC architecture. ROBIN leverages insights into the data dependency characteristics of error patterns to tailor its encoding structure, thereby transcending the error-correction constraints of conventional schemes. Experimental results demonstrate that ROBIN reduces cache error rates by an average of 28.6Γ— with low overhead, effectively neutralizing the 151.7% error rate increase induced by data-dependent effects and substantially enhancing cache reliability.

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πŸ“ Abstract
Spin-Transfer Torque Magnetic RAM (STT-MRAM) is a promising alternative for SRAMs in on-chip cache memories. Besides all its advantages, high error rate in STT-MRAM is a major limiting factor for on-chip cache memories. In this paper, we first present a comprehensive analysis that reveals that the conventional Error-Correcting Codes (ECCs) lose their efficiency due to data-dependent error patterns, and then propose an efficient ECC configuration, so-called ROBIN, to improve the correction capability. The evaluations show that the inefficiency of conventional ECC increases the cache error rate by an average of 151.7% while ROBIN reduces this value by more than 28.6x.
Problem

Research questions and friction points this paper is trying to address.

STT-MRAM
Error-Correcting Codes
cache reliability
error rate
data-dependent errors
Innovation

Methods, ideas, or system contributions that make the work stand out.

Incremental ECC
Oblique Interleaving
STT-MRAM
Error-Correcting Codes
Data-Dependent Errors
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