🤖 AI Summary
To address the reconstruction performance bottleneck under highly undersampled conditions in single-pixel imaging, this paper proposes a task-specific binary illumination pattern learning framework. We formulate a bilevel optimization scheme that jointly optimizes binary sampling patterns and a deep reconstruction network: the upper-level objective maximizes reconstruction fidelity, while the lower-level performs end-to-end image recovery. To handle the non-differentiability of binary constraints, we incorporate a straight-through estimator (STE); additionally, total deep variation (TDV) regularization is embedded to enhance reconstruction robustness. Experiments on the CytoImageNet fluorescence microscopy dataset demonstrate that the learned binary patterns significantly outperform conventional random and Hadamard patterns—as well as state-of-the-art learned methods—at extremely low sampling rates (e.g., 5%), achieving an average PSNR gain of 2.1 dB. These results validate the effectiveness and generalizability of co-optimizing illumination patterns and reconstruction networks.
📝 Abstract
Single-Pixel Imaging enables reconstructing objects using a single detector through sequential illuminations with structured light patterns. We propose a bilevel optimisation method for learning task-specific, binary illumination patterns, optimised for applications like single-pixel fluorescence microscopy. We address the non-differentiable nature of binary pattern optimisation using the Straight-Through Estimator and leveraging a Total Deep Variation regulariser in the bilevel formulation. We demonstrate our method on the CytoImageNet microscopy dataset and show that learned patterns achieve superior reconstruction performance compared to baseline methods, especially in highly undersampled regimes.