NumBench: Diagnosing Counting Failures in Text-to-Image Models

📅 2026-08-28
📈 Citations: 0
Influential: 0
📄 PDF
🤖 AI Summary
研究解决了文本到图像模型中对象数量生成错误的问题,通过创建NumBench基准和开发新的评价方法cwnps来诊断并评估不同条件下模型的表现。
📝 Abstract
Text-to-image (T2I) models often generate the wrong number of objects, yet existing benchmarks are too small or weakly controlled to explain why. We introduce \textbf{NumBench}, a benchmark of 640{,}000 prompts spanning 1{,}600 categories and counts from 1 to 100. Its factorial design varies object composition, spatial guidance, and appearance conditions while balancing counts and category exposure. We also develop a process model in which requested instances compete for a finite set of resolvable image regions. The model predicts a near-quadratic collision deficit at low occupancy and shows how coordinated placement reduces it. For scalable evaluation, we propose the Confidence-Weighted Numeric Precision Score (\cwnps), which aggregates three calibrated detectors and discounts uncertain proposals. Across five commercial systems, two open models, and two specialized counting methods, performance declines sharply with requested count; all evaluated methods are weak above 50 objects. Count range has the largest measured effect, followed by layout and composition. Grid guidance is strongest among guided layouts, consistent with the coordination prediction, although the analysis does not establish collision as the sole cause. A 14{,}400-image human study supports automated evaluation through count 50, while results on 243 natural-language prompts show transfer beyond NumBench templates.
Problem

Research questions and friction points this paper is trying to address.

Text-to-Image Models
Counting Failures
Benchmarks
Innovation

Methods, ideas, or system contributions that make the work stand out.

NumBench
text-to-image models
counting failures
CWNPS
process model
💼 Related Jobs
No related jobs found.
S
Sandeep Wadhwa
Indian Institute of Technology Jodhpur, India
Mayank Vatsa
Mayank Vatsa
Professor, IIT Jodhpur
biometricsimage processingdeep learningmachine learningcomputer vision
Richa Singh
Richa Singh
Professor, IIT Jodhpur
BiometricsPattern RecognitionMachine LearningFace RecognitionDeep Learning
P
Parrva Chirag Shah
Indian Institute of Technology Jodhpur, India
P
Prakhar Galriya
Shiv Nadar University, India