UniPCB: A Generation-Assisted Detection Framework for PCB Defect Inspection

📅 2026-05-06
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📝 Abstract
Printed Circuit Board (PCB) defect inspection faces two compounding challenges: scarce and imbalanced defect samples that limit model training, and insufficient feature representation under complex circuit backgrounds. Existing generation methods rely on single-modality conditions with coarse structural control, while detection methods improve architectures without addressing the data bottleneck. To resolve both challenges jointly, we propose a generation-assisted PCB defect inspection framework that integrates controlled defect synthesis with task-specific defect detection. On the generation side, a Multi-modal Condition Generator extracts complementary edge, depth, and text conditions in parallel. A ScaleEncoder then embeds these conditions into the diffusion U-Net at four resolutions, and a Condition Modulation applies FiLM-style spatially-adaptive modulation at each scale, enabling structurally aligned and defect-aware sample synthesis. On the detection side, an Inverted Residual Shift Attention couples self-attention with shift-wise convolution to jointly capture global context and local texture, and a Cross-level Complementary Fusion Block generates pixel-level gates for selective cross-level feature fusion. The synthesized samples directly enrich the detection training set, so that improvements in generation compound with improvements in detection. Extensive experiments on DsPCBSD+ demonstrate that UniPCB achieves mAP@0.5 of 98.0% and mAP@0.5:0.95 of 61.8% on defect detection, surpassing all compared methods, while the generation branch attains an FID of 129.61 and SSIM of 0.619, outperforming existing conditional generation approaches.
Problem

Research questions and friction points this paper is trying to address.

PCB defect inspection
scarce defect samples
imbalanced data
feature representation
complex circuit background
Innovation

Methods, ideas, or system contributions that make the work stand out.

Multi-modal Condition Generation
Condition Modulation
Inverted Residual Shift Attention
Cross-level Complementary Fusion
Generation-assisted Detection