WACA-UNet: Weakness-Aware Channel Attention for Static IR Drop Prediction in Integrated Circuit Design

📅 2025-07-25
📈 Citations: 0
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🤖 AI Summary
To address the low spatial prediction accuracy, high computational overhead, and insufficient modeling of multi-source heterogeneous inputs in static IR-drop analysis for VLSI design, this paper proposes an attention-based U-Net framework incorporating weak-aware channel-wise gating. The method encodes metal-layer distributions, via patterns, and current-density maps as multi-channel physical layout inputs to formulate a pixel-wise regression task. A novel two-stage gated channel attention mechanism is introduced to dynamically enhance weakly responsive features while suppressing dominant channels, explicitly capturing channel heterogeneity. ConvNeXtV2 serves as the backbone for end-to-end joint modeling. Evaluated on the ICCAD-2023 benchmark, the proposed method achieves a 61.1% reduction in mean absolute error and a 71.0% improvement in F1 score, demonstrating significant gains in both prediction accuracy and robustness.

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📝 Abstract
Accurate spatial prediction of power integrity issues, such as IR drop, is critical for reliable VLSI design. However, traditional simulation-based solvers are computationally expensive and difficult to scale. We address this challenge by reformulating IR drop estimation as a pixel-wise regression task on heterogeneous multi-channel physical maps derived from circuit layouts. Prior learning-based methods treat all input layers (e.g., metal, via, and current maps) equally, ignoring their varying importance to prediction accuracy. To tackle this, we propose a novel Weakness-Aware Channel Attention (WACA) mechanism, which recursively enhances weak feature channels while suppressing over-dominant ones through a two-stage gating strategy. Integrated into a ConvNeXtV2-based attention U-Net, our approach enables adaptive and balanced feature representation. On the public ICCAD-2023 benchmark, our method outperforms the ICCAD-2023 contest winner by reducing mean absolute error by 61.1% and improving F1-score by 71.0%. These results demonstrate that channel-wise heterogeneity is a key inductive bias in physical layout analysis for VLSI.
Problem

Research questions and friction points this paper is trying to address.

Accurate spatial prediction of IR drop in VLSI design
Traditional simulation-based solvers are computationally expensive
Existing methods ignore varying importance of input layers
Innovation

Methods, ideas, or system contributions that make the work stand out.

Weakness-Aware Channel Attention mechanism
Pixel-wise regression on multi-channel maps
ConvNeXtV2-based attention U-Net integration
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