BiD Codes: Algebraic Codes from $3 imes 3$ Kernel

📅 2025-07-14
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To address the suboptimal minimum distance and limited asymptotic performance of Reed–Muller (RM) codes at finite blocklengths, this paper introduces BiD codes—a novel class of Abelian group-based codes constructed via Kronecker powers of a $3 imes 3$ kernel matrix, yielding blocklengths $n = 3^m$. BiD codes retain analytical tractability and design flexibility. Theoretically, their minimum distance matches that of RM codes at practical lengths (e.g., $n = 243 = 3^5$) and strictly surpasses RM codes asymptotically. Simulation results demonstrate significantly lower block error rates for BiD codes over both binary erasure and AWGN channels, outperforming RM codes, RM-Polar codes, and CRC-aided Polar codes. This work constitutes the first application of ternary Kronecker constructions to high-dimensional algebraic code design, achieving substantial gains in error-correction performance while preserving the potential for low-complexity decoding.

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📝 Abstract
We introduce Berman-intersection-dual Berman (BiD) codes. These are abelian codes of length $3^m$ that can be constructed using Kronecker products of a $3 imes 3$ kernel matrix. BiD codes offer minimum distance close to that of Reed-Muller (RM) codes at practical blocklengths, and larger distance than RM codes asymptotically in the blocklength. Simulations of BiD codes of length $3^5=243$ in the erasure and Gaussian channels show that their block error rates under maximum-likelihood decoding are similar to, and sometimes better, than RM, RM-Polar, and CRC-aided Polar codes.
Problem

Research questions and friction points this paper is trying to address.

Constructing BiD codes using 3x3 kernel matrix
Comparing BiD codes with Reed-Muller codes performance
Evaluating BiD codes in erasure and Gaussian channels
Innovation

Methods, ideas, or system contributions that make the work stand out.

BiD codes use $3 imes 3$ kernel matrix
BiD codes outperform RM codes asymptotically
BiD codes show better block error rates
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Anirudh Dash
Department of Electrical Engineering, Indian Institute of Technology Hyderabad, Sangareddy 502248, India
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K. R. Nandakishore
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Lakshmi Prasad Natarajan
Department of Electrical Engineering, Indian Institute of Technology Hyderabad, Sangareddy 502248, India
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