🤖 AI Summary
该研究通过结合数据重要性和网络安全漏洞，使用Dempster-Shafer理论评估IIoT传感器节点的关键性，提出了一种新的框架来解决工业物联网中的安全问题。
📝 Abstract
The integration of the Industrial Internet of Things (IIoT) into manufacturing has transformed industrial operations by optimising production management and ensuring product quality through smart industrial sensors that regulate processes based on real-time data. However, these sensor nodes are highly vulnerable to cyber threats, posing significant security risks that compromise their reliability and integrity. While existing research explores cybersecurity vulnerabilities and cyberattack-based methods for ranking critical nodes, some studies assess node criticality based on the impact of sensor data on product quality. However, a comprehensive approach that integrates both data criticality and cybersecurity vulnerability remains unexplored. To bridge this gap, this study introduces a novel framework that evaluates IIoT sensor node criticality by leveraging Dempster--Shafer (D-S) theory to fuse data criticality and cybersecurity vulnerabilities. The proposed method is validated using a dataset from red wine production, demonstrating its effectiveness in ranking sensor nodes based on both factors. The results show that criticality rankings based on security vulnerability scores computed using CVSS version 4.0 differ significantly from those obtained with CVSS version 3.1, highlighting the influence of enhanced vulnerability assessment methodologies. While initially applied to wine manufacturing, this framework is adaptable to broader industrial applications with minimal modifications, offering a robust approach to securing IIoT-enabled production systems.