Experimental Verification of Fast Voltage Droop Correction Circuits

📅 2026-08-20
📈 Citations: 0
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🤖 AI Summary
为解决VLSI电路中电压骤降限制工作频率的问题,本文提出并验证了一种基于IHP 130nm工艺的快速全数字自适应响应电路。
📝 Abstract
Due to the trend towards minimizing guard bands for energy saving purposes, voltage droops are a key limiting factor for the operational frequency of today's VLSI circuits. Adapting clock frequencies dynamically presents the challenge of metastability in the device that detects and stores the existence of voltage droops. We present an implementation of a fast all-digital circuit for adaptive response to droops using the IHP 130 nm process. The description of the design is presented in an accompanying paper. We experimentally validate the functionality of the design on a test chip.
Problem

Research questions and friction points this paper is trying to address.

voltage droops
VLSI circuits
metastability
Innovation

Methods, ideas, or system contributions that make the work stand out.

fast all-digital circuit
voltage droop
adaptive response
IHP 130nm process
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