🤖 AI Summary
本文研究了模拟计算内存(CIM)非理想性对扩散变换器(DiT)采样的影响,并提出了一种无需重新训练的采样器端重校准方法,通过调整CFG尺度来恢复生成质量。
📝 Abstract
Diffusion Transformers (DiTs) incur high memory traffic and energy costs because sampling repeatedly evaluates large denoisers dominated by linear operations. Analog compute-in-memory (CIM) can alleviate these costs by executing linear operations within weight-storing memory arrays. However, CIM nonidealities perturb effective weights, with errors accumulating along the state-dependent denoising trajectory; their interaction with classifier-free guidance (CFG) remains underexplored. In this paper, we characterize the impact of analog CIM nonidealities on DiT sampling. Although conditional and unconditional predictions can each remain close to their clean counterparts, their difference (the CFG residual) is disproportionately attenuated and rotated. Identifying this residual as a controllable failure channel, we propose a retraining-free, sampler-side recalibration that adjusts only the CFG scale for a given CIM condition. Trajectory-level analysis shows that moderate recalibration strengthens the target-oriented component preserved in the distorted residual, enabling earlier commitment to a prompt-consistent semantic region. In contrast, excessive guidance amplifies the full noisy residual and degrades quality, resulting in a finite, noise-dependent optimum. Extensive experiments on PixArt-Sigma, PixArt-alpha, and DiT-XL/2 show that the optimal guidance scale increases with CIM noise. Using 30,000 samples per condition, guidance recalibration consistently restores generation quality across simulated CIM mappings, closing at least 87% of the CIM-induced FID gap at a CIM noise level of 0.20. It reduces FID from 59.22 to 20.49 on PixArt-Sigma, 72.37 to 21.12 on PixArt-alpha, and 20.89 to 6.62 on DiT-XL/2.