Problem
Research questions and friction points this paper is trying to address.
3D-IC
benchmark
heterogeneous integration
An Open-Source Benchmark Suite of 3D-IC Testcases
🤖 AI Summary
为了解决3D-IC设计面临的物理设计挑战，本文提供了一个开源的3D-IC测试案例基准套件，涵盖多种芯片组件，以促进该领域研究进展。
📝 Abstract
The physical design community has benefited from standardized, publicly available benchmark suites, which have enabled reproducible evaluation and driven significant advances in 2D place-and-route algorithms over the past three decades. However, the emergence of 3D heterogeneous integration technologies, including through-silicon vias (TSVs), hybrid bonding, and chiplet-based architectures, has introduced new physical design challenges that are not captured by existing planar benchmarks. Although several 3D-IC design examples have been reported, publicly accessible and scalable benchmark suites that enable reproducible evaluation across different 3D physical design problems remain limited. In this paper, we present an open-source suite of 3D-IC benchmark testcases derived from representative chiplet-based case studies in CATCH, an open-source framework for estimating the cost of heterogeneous integration architectures. The proposed benchmark suite provides reusable virtual chiplet models covering compute, memory, I/O, analog, and substrate components. Each testcase captures essential physical design characteristics of 3D systems, including heterogeneous die integration, inter-die connectivity, and technology-dependent design constraints. By publicly releasing these benchmarks, we aim to establish a common evaluation platform and accelerate community-wide research progress in 3D heterogeneous integration.
Innovation
Methods, ideas, or system contributions that make the work stand out.
3D-IC
benchmark suite
open-source
heterogeneous integration
virtual chiplet models
🔎 Similar Papers
No similar papers found.
